Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
: At Leiden Embedded Research Center (LERC), we are building a tool chain called Compaan/Laura that allows us to map rapidly and efficiently signal processing applications written ...
Steven Derrien, Alexandru Turjan, Claudiu Zissules...
Hierarchies are a powerful tool for image segmentation, they produce a multiscale representation which allows to design robust algorithms and can be stored in tree-like structures...
Juan Cardelino, Vicent Caselles, Marcelo Bertalm&i...
We present a technique for synthesizing power- as well as area-optimized circuits from hierarchical data flow graphs under throughput constraints. We allow for the use of complex...
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...