13 search results - page 3 / 3 » Power and area optimization by reorganizing CMOS complex gat... |
DAC
2009
ACM
14 years 7 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
MICRO
2010
IEEE
13 years 4 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
IPPS
2006
IEEE
14 years 8 days ago
2006
IEEE
The development of Field Programmable Gate Arrays (FPGAs) had tremendous improvements in the last few years. They were extended from simple logic circuits to complex Systems-on-Ch...