232 search results - page 6 / 47 » Practical aspects of reliability analysis for IC designs |
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
ACMDIS
2000
ACM
15 years 2 months ago
2000
ACM
Through a study of web site design practice, we observed that web site designers employ multiple representations of web sites as they progress through the design process, and that...
77
Voted
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
73
Voted
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
DAC
2001
ACM
15 years 10 months ago
2001
ACM
This work presents a new and computationally efficient performance optimization technique for distributed RLC interconnects based on a rigorous delay computation scheme. The new o...