232 search results - page 8 / 47 » Practical aspects of reliability analysis for IC designs |
68
Voted
ICCD
2005
IEEE
15 years 6 months ago
2005
IEEE
The advent of nanometer feature sizes in silicon fabrication has triggered a number of new design challenges for computer designers. These challenges include design complexity and...
COMPSAC
2000
IEEE
15 years 2 months ago
2000
IEEE
In this paper, we first show that the logistic testing-effort function is practically acceptable/helpful for modeling software reliability growth and providing a reasonable descri...
SEKE
2005
Springer
15 years 3 months ago
2005
Springer
Design combinatorial theory for test-case generation has been used successfully in the past. It is useful in optimizing test cases as it is practically impossible to exhaustively t...
62
Voted
CVIU
2008
14 years 9 months ago
2008
It is frequently remarked that designers of computer vision algorithms and systems cannot reliably predict how algorithms will respond to new problems. A variety of reasons have b...
77
Voted
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...