We present a comprehensive approach to address three challenging problems in face recognition: modelling faces across multi-views, extracting the non-linear discriminating feature...
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Abstract. Traditional workflow enactment systems and workflow design processes view the workflow as a one-time interaction with the various data sources, executing a series of step...
Panayiotis Neophytou, Panos K. Chrysanthis, Alexan...
Energy is increasingly a first-order concern in computer systems. Exploiting energy-accuracy trade-offs is an attractive choice in applications that can tolerate inaccuracies. Re...
Adrian Sampson, Werner Dietl, Emily Fortuna, Danus...
ensitivity has emerged as an excellent context abstraction for points-to analysis in object-oriented languages. Despite its practical success, however, object-sensitivity is poorl...
Yannis Smaragdakis, Martin Bravenboer, Ondrej Lhot...