8022 search results - page 40 / 1605 » Predictability in Critical Systems |
TFS
2008
14 years 11 months ago
2008
A reliable monitoring system is critically needed in a wide range of industries to detect the occurrence of a fault to prevent machinery performance degradation, malfunction, and s...
DAC
2006
ACM
16 years 23 days ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
ISPD
2000
ACM
15 years 4 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
ISCAS
2007
IEEE
15 years 6 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
VISUALIZATION
1999
IEEE
15 years 4 months ago
1999
IEEE
We describe a framework for time-critical rendering of graphics scenes composed of a large number of objects having complex geometric descriptions. Our technique relies upon a sce...