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137
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ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
124
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BMCBI
2007
15 years 3 months ago
2007
Background: 3D-Jury, the structure prediction consensus method publicly available in the Meta Server http://meta.bioinfo.pl/, was evaluated using models gathered in the 7th round ...
123
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ITP
2006
15 years 3 months ago
2006
Purpose
143
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ICS
2003
Tsinghua U.
15 years 9 months ago
2003
Tsinghua U.
Communication latencies within critical sections constitute a major bottleneck in some classes of emerging parallel workloads. In this paper, we argue for the use of Inferentially...
127
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DAC
2005
ACM
16 years 4 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...