10 search results - page 2 / 2 » Predicting Coupled Noise in RC Circuits |
DATE
2005
IEEE
15 years 2 months ago
2005
IEEE
This paper reports a novel simulation methodology for analysis and prediction of substrate noise impact on analog / RF circuits taking into account the role of the parasitic resis...
125
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GLVLSI
2006
IEEE
15 years 6 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
116
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DAC
2003
ACM
15 years 5 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
TCAD
2002
15 years 4 hour ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
80
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GLVLSI
2006
IEEE
15 years 6 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...