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DATE
2008
IEEE
91views Hardware» more  DATE 2008»
15 years 11 months ago
Fault Clustering in deep-submicron CMOS Processes
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
Jan Schat
ANLP
2000
115views more  ANLP 2000»
15 years 6 months ago
An Empirical Assessment of Semantic Interpretation
We introduce a framework for semantic interpretation in which dependency structures are mapped to conceptual representations based on a parsimonious set of interpretation schemata...
Martin Romacker, Udo Hahn
KBSE
2005
IEEE
15 years 10 months ago
Automated replay and failure detection for web applications
User-session-based testing of web applications gathers user sessions to create and continually update test suites based on real user input in the field. To support this approach ...
Sara Sprenkle, Emily Gibson, Sreedevi Sampath, Lor...
137
Voted
VLSID
2001
IEEE
117views VLSI» more  VLSID 2001»
16 years 5 months ago
Dynamic Voltage Scheduling Using Adaptive Filtering of Workload Traces
Abstract - An adaptive approach for dynamic voltage scheduling on processors is presented based on workload prediction by filtering a trace history. The effects of update frequency...
Amit Sinha, Anantha Chandrakasan
CONTEXT
2007
Springer
15 years 11 months ago
OCCAM: Ontology-Based Computational Contextual Analysis and Modeling
The ability to model cognitive agents depends crucially on being able to encode and infer with contextual information at many levels (such as situational, psychological, social, or...
Srini Narayanan, Katie Sievers, Steven J. Maiorano