3819 search results - page 300 / 764 » Predicting Dependability by Testing |
150
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CIMCA
2008
IEEE
15 years 11 months ago
2008
IEEE
With the advent of e-Commerce, enterprises can no longer rely on static business strategies. They have to be able to cope in dynamic and uncertain electronic environments, especia...
142
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ISQED
2008
IEEE
15 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
133
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IPTPS
2005
Springer
15 years 10 months ago
2005
Springer
Most earlier studies of DHTs under churn have either depended on simulations as the primary investigation tool, or on establishing bounds for DHTs to function. In this paper, we pr...
127
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SPAA
2010
ACM
15 years 9 months ago
2010
ACM
Consider a set of players that are interested in collectively evaluating a set of objects. We develop a collaborative scoring protocol in which each player evaluates a subset of t...
110
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ECML
2001
Springer
15 years 9 months ago
2001
Springer
When correct priors are known, Bayesian algorithms give optimal decisions, and accurate confidence values for predictions can be obtained. If the prior is incorrect however, these...