12943 search results - page 2359 / 2589 » Predicting When Not to Predict |
153
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
135
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
Daedalus is a system-level design flow for the design of multiprocessor system-on-chip (MP-SoC) based embedded multimedia systems. It offers a fully integrated tool-flow in which ...
138
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
125
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DAC
1999
ACM
16 years 5 months ago
1999
ACM
We propose a new VLSI layout methodology which addresses the main problems faced in Deep Sub-Micron (DSM) integrated circuit design. Our layout "fabric" scheme eliminate...
131
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DAC
2000
ACM
16 years 5 months ago
2000
ACM
Continuous scaling of VLSI circuits is reducing gate delays but rapidly increasing interconnect delays. Semiconductor Industry Association (SIA) roadmap predicts that, beyond the ...