592 search results - page 67 / 119 » Predicting faults using the complexity of code changes |
145
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INFOCOM
2009
IEEE
15 years 11 months ago
2009
IEEE
The erasure resilience of rateless codes, such as Luby-Transform (LT) codes, makes them particularly suitable to a wide variety of loss-prone wireless and sensor network applicati...
144
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ITC
1998
IEEE
15 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
144
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
139
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GECCO
2007
Springer
15 years 10 months ago
2007
Springer
The Blob Code is a bijective tree code that represents each tree on n labelled vertices as a string of n − 2 vertex labels. In recent years, several researchers have deployed th...
142
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IWPSE
2007
IEEE
15 years 11 months ago
2007
IEEE
The starting point for software evolution is usually a change request, expressing the new or updated requirements on the delivered system. The requirements specified in a change ...