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ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
15 years 11 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
DSD
2007
IEEE
105views Hardware» more  DSD 2007»
15 years 11 months ago
Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
RTCSA
2007
IEEE
15 years 11 months ago
Modeling Real-time Garbage Collection Cost
Given the major advantages of productivity and safety, the use of garbage collection (GC) in real-time systems has gained increasing attention. Guaranteeing garbage collection act...
Wei Fu, Carl Hauser
NIPS
2008
15 years 6 months ago
Local Gaussian Process Regression for Real Time Online Model Learning
Learning in real-time applications, e.g., online approximation of the inverse dynamics model for model-based robot control, requires fast online regression techniques. Inspired by...
Duy Nguyen-Tuong, Matthias Seeger, Jan Peters
ICASSP
2011
IEEE
14 years 8 months ago
Evaluating music sequence models through missing data
Building models of the structure in musical signals raises the question of how to evaluate and compare different modeling approaches. One possibility is to use the model to impute...
Thierry Bertin-Mahieux, Graham Grindlay, Ron J. We...