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TCAD
2008
114views more  TCAD 2008»
15 years 4 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
TCAD
2010
150views more  TCAD 2010»
14 years 11 months ago
Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks
Artificial neural networks (ANNs) have shown great promise in modeling circuit parameters for computer aided design applications. Leakage currents, which depend on process paramete...
Janakiraman Viraraghavan, Bharadwaj Amrutur, V. Vi...
SIGIR
2009
ACM
15 years 11 months ago
Fast nonparametric matrix factorization for large-scale collaborative filtering
With the sheer growth of online user data, it becomes challenging to develop preference learning algorithms that are sufficiently flexible in modeling but also affordable in com...
Kai Yu, Shenghuo Zhu, John D. Lafferty, Yihong Gon...
NIPS
1998
15 years 6 months ago
An Entropic Estimator for Structure Discovery
We introduce a novel framework for simultaneous structure and parameter learning in hidden-variable conditional probability models, based on an entropic prior and a solution for i...
Matthew Brand
WSC
1998
15 years 6 months ago
Using Simulation to Optimize a Horizontal Carousel Storage System
Carousel storage systems are often used to increase storage density, throughput and efficiency while reducing inventory and man-hours. The Hewlett-Packard company has developed a ...
Todd LeBaron, Michael L. Hoffman