At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Artificial neural networks (ANNs) have shown great promise in modeling circuit parameters for computer aided design applications. Leakage currents, which depend on process paramete...
Janakiraman Viraraghavan, Bharadwaj Amrutur, V. Vi...
With the sheer growth of online user data, it becomes challenging to develop preference learning algorithms that are sufficiently flexible in modeling but also affordable in com...
Kai Yu, Shenghuo Zhu, John D. Lafferty, Yihong Gon...
We introduce a novel framework for simultaneous structure and parameter learning in hidden-variable conditional probability models, based on an entropic prior and a solution for i...
Carousel storage systems are often used to increase storage density, throughput and efficiency while reducing inventory and man-hours. The Hewlett-Packard company has developed a ...