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79
Voted
ISSRE
2002
IEEE
15 years 2 months ago
2002
IEEE
Formal analysis of software is a powerful analysis tool, but can be too costly. Random search of formal models can reduce that cost, but is theoretically incomplete. However, rand...
88
Voted
DAC
1997
ACM
15 years 1 months ago
1997
ACM
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...
101
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ISSTA
2007
ACM
14 years 11 months ago
2007
ACM
Progress in testing requires that we evaluate the effectiveness of testing strategies on the basis of hard experimental evidence, not just intuition or a priori arguments. Random ...
ISSTA
1996
ACM
15 years 1 months ago
1996
ACM
In assessing the quality of software, we would like to make engineering judgements similar to those based on statistical quality control. Ideally, we want to support statements li...
VTS
2002
IEEE
15 years 2 months ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...