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DATE
2009
IEEE
115views Hardware» more  DATE 2009»
15 years 4 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
KBSE
2002
IEEE
15 years 2 months ago
What Makes Finite-State Models More (or Less) Testable?
Finite-state machine (FSM) models are commonly used to represent software with concurrent processes. Established model checking tools can be used to automatically test FSM models,...
David Owen, Tim Menzies, Bojan Cukic
IPPS
2000
IEEE
15 years 2 months ago
Predicting Performance on SMPs. A Case Study: The SGI Power Challenge
We study the issue of performance prediction on the SGIPower Challenge, a typical SMP. On such a platform, the cost of memory accesses depends on their locality and on contention ...
Nancy M. Amato, Jack Perdue, Mark M. Mathis, Andre...
CASCON
1996
118views Education» more  CASCON 1996»
14 years 11 months ago
On predicting reliability of modules using code coverage
The estimation of reliability of modules using code coverage is motivated by a two-phase method for estimating the quality of software using static structure and predicted quality...
Saileshwar Krishnamurthy, Aditya P. Mathur
ISSRE
2002
IEEE
15 years 2 months ago
Mutation of Java Objects
Fault insertion based techniqueshave been used for measuring test adequacy and testability of programs. Mutation analysis inserts faults into a program with the goal of creating m...
Roger T. Alexander, James M. Bieman, Sudipto Ghosh...