The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...
The Support Vector Machine (SVM) is an interesting classifier with excellent power of generalization. In this paper, we consider applying the SVM to semi-supervised learning. We p...
A novel evolutionary approach for the bin packing problem (BPP) is presented. A simple steady-state genetic algorithm is developed that produces results comparable to other approa...
Network on Chip (NoC) is a new paradigm for designing core based System on Chip which supports high degree of reusability and is scalable. In this paper we describe an efficient t...
Intermediate measurements in quantum circuits compare to conditional branchings in programming languages. Due to this, quantum circuits have a natural linear-tree structure. In thi...