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116
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
140
Voted
CEC
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— Target shape design optimization problem (TSDOP) is a miniature model for real world design optimization problems. It is proposed as a test bed to design and analyze op...
122
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CISS
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract. Spectrally phase-coded optical code division multiple access (OCDMA), demodulated with phase and polarization diversity devices, exhibits high spectral efficiency and low...
132
Voted
IOLTS
2007
IEEE
15 years 9 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
120
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PG
2007
IEEE
15 years 9 months ago
2007
IEEE
A new geometry-based finite difference method for a fast and reliable detection of perceptually salient curvature extrema on surfaces approximated by dense triangle meshes is pro...