Many combinatorial problems--such as the traveling salesman, feedback arcset, cutwidth, and treewidth problem-can be formulated as finding a feasible permutation of n elements. Ty...
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
— Circuit and processor designs will continue to increase in complexity for the foreseeable future. With these increasing sizes comes the use of wide buses to move large amounts ...
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
Three dimensional vertically integrated systems allow active devices to be placed on multiple device layers. In recent years, a number of research efforts have addressed physical ...