In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
We introduce S-DUDE, a new algorithm for denoising Discrete Memoryless Channel (DMC)-corrupted data. The algorithm, which generalizes the recently introduced DUDE (Discrete Univer...
The max-sum classifier predicts n-tuple of labels from n-tuple of observable variables by maximizing a sum of quality functions defined over neighbouring pairs of labels and obser...
Abstract. We study the problem of minimizing the maximum latency of flows in networks with congestion. We show that this problem is NP-hard, even when all arc latency functions ar...
: Scattering of neutrons and x-rays from molecules in solution offers alternative approaches to the studying of a wide range of macromolecular structures in their solution state w...
Paritosh A. Kavathekar, Bruce A. Craig, Alan M. Fr...