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WSC
1998
15 years 1 months ago
A Rapid Modeling Technique for Measurable Improvements in Factory Performance
This paper discusses a methodology for quickly investigating problem areas in semiconductor wafer fabrication factories by creating a model for the production area of interest onl...
Andreas Peikert, Josef Thoma, Steven Brown
COMPUTER
2008
51views more  COMPUTER 2008»
14 years 12 months ago
Measuring Multicore Performance
Shay Gal-On, Markus Levy
CSE
2008
IEEE
14 years 12 months ago
Measuring High-Performance Computing with Real Applications
Mohamed Sayeed, Hansang Bae, Yili Zheng, Brian Arm...
CONCURRENCY
2006
91views more  CONCURRENCY 2006»
14 years 12 months ago
Measuring and modelling the performance of a parallel ODMG compliant object database server
Sandra de F. Mendes Sampaio, Norman W. Paton, Jim ...
CII
2007
39views more  CII 2007»
14 years 12 months ago
Performance measurement
Paul Valckenaers