Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Abstract. We present a novel approach to structure learning for graphical models. By using nonparametric estimates to model clique densities in decomposable models, both discrete a...
This paper presents a dependency language model (DLM) that captures linguistic constraints via a dependency structure, i.e., a set of probabilistic dependencies that express the r...
This paper addresses the problem of tracking objects which undergo rapid and significant appearance changes. We propose a novel coupled-layer visual model that combines the targe...
In many machine learning problems, labeled training data is limited but unlabeled data is ample. Some of these problems have instances that can be factored into multiple views, ea...