An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
In this paper we consider a single item, discrete time, lot sizing situation where demand is random and its parameters (e.g., mean and standard deviation) can change with time. Fo...
The (neo-)evolutionary model of a Triple Helix of University-Industry-Government Relations focuses on the overlay of expectations, communications, and interactions that potentiall...
This work presents a proposal to diagnose distributed systems utilizing model-based diagnosis using distributed databases. In order to improve aspects as versatility, persistence,...
When we construct a model of origami (a model of a folded sheet of paper) in a computer, it is usual to represent the model as a set of polygons having zero thickness. One of the t...