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ITC
2003
IEEE
129views Hardware» more  ITC 2003»
15 years 9 months ago
Relating Yield Models to Burn-In Fall-Out in Time
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Thomas S. Barnett, Adit D. Singh
EOR
2008
95views more  EOR 2008»
15 years 3 months ago
Augmenting the lot sizing order quantity when demand is probabilistic
In this paper we consider a single item, discrete time, lot sizing situation where demand is random and its parameters (e.g., mean and standard deviation) can change with time. Fo...
I. Nyoman Pujawan, Edward A. Silver
115
Voted
CORR
2010
Springer
97views Education» more  CORR 2010»
15 years 3 months ago
Knowledge-Based Innovation Systems and the Model of a Triple Helix of University-Industry-Government Relations
The (neo-)evolutionary model of a Triple Helix of University-Industry-Government Relations focuses on the overlay of expectations, communications, and interactions that potentiall...
Loet Leydesdorff
AINA
2006
IEEE
15 years 7 months ago
Distributed Model-Based Diagnosis using Object-Relational Constraint Databases
This work presents a proposal to diagnose distributed systems utilizing model-based diagnosis using distributed databases. In order to improve aspects as versatility, persistence,...
María Teresa Gómez López, Raf...
SG
2009
Springer
15 years 10 months ago
A Rendering Method for 3D Origami Models Using Face Overlapping Relations
When we construct a model of origami (a model of a folded sheet of paper) in a computer, it is usual to represent the model as a set of polygons having zero thickness. One of the t...
Yohsuke Furuta, Jun Mitani, Yukio Fukui