15073 search results - page 2689 / 3015 » Probabilistic algorithms for computing resultants |
132
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
144
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...
159
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
125
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...
157
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Abstract. Embedded multimedia systems often run multiple time-constrained applications simultaneously. These systems use multiprocessor systems-on-chip of which it must be guarante...