In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
It has been widely observed that there is no single "dominant" SAT solver; instead, different solvers perform best on different instances. Rather than following the trad...
Lin Xu, Frank Hutter, Holger H. Hoos, Kevin Leyton...
Current technological developments and application-driven demands are bringing us closer to the realization of autonomous multirobot systems performing increasingly complex missio...
Let Ng(f ) denote the number of rooted maps of genus g having f edges. An exact formula for Ng(f ) is known for g = 0 (Tutte, 1963), g = 1 (Arques, 1987), g = 2,3 (Bender and Canf...
We present robust and efficient algorithms for computing Voronoi diagrams of planar freeform curves. Boundaries of the Voronoi diagram consist of portions of the bisector curves b...