In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunder...
In this paper, we give a necessary and sufficient condition for the existence of partially-dependent functional decomposition and develop new algorithms to compute such decomposi...
A new "herding" algorithm is proposed which directly converts observed moments into a sequence of pseudo-samples. The pseudosamples respect the moment constraints and ma...
We show that a classifier based on Gaussian mixture models (GMM) can be trained discriminatively to improve accuracy. We describe a training procedure based on the extended Baum-W...
c Abstraction for Worst-Case Analysis of Discrete Systems Felice Balarin Cadence Berkeley Laboratories Recently, a methodology for worst-case analysis of discrete systems has been...