8808 search results - page 1564 / 1762 » Process Change Patterns |
VLSID
2010
IEEE
14 years 9 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
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ACSAC
2010
IEEE
14 years 8 months ago
2010
IEEE
Code injection continues to pose a serious threat to computer systems. Among existing solutions, W X is a notable approach to prevent the execution of injected code. In this paper...
ASPDAC
2010
ACM
14 years 8 months ago
2010
ACM
Abstract--Phase-Change Random Access Memory (PRAM) has become one of the most promising emerging memory technologies, due to its attractive features such as high density, fast acce...
BMVC
2010
14 years 8 months ago
2010
Among various factors that can affect the performance of gait recognition, changes in viewpoint pose the biggest problem. In this work, we develop a novel approach to cross-view g...
BMVC
2010
14 years 8 months ago
2010
In this paper, we propose a novel manifold alignment method by learning the underlying common manifold with supervision of corresponding data pairs from different observation sets...