8808 search results - page 1599 / 1762 » Process Change Patterns |
ICSE
2007
IEEE-ACM
15 years 10 months ago
2007
IEEE-ACM
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
SDM
2009
SIAM
15 years 7 months ago
2009
SIAM
The primary constraint in the effective mining of data streams is the large volume of data which must be processed in real time. In many cases, it is desirable to store a summary...
ALT
2004
Springer
15 years 7 months ago
2004
Springer
Different formal learning models address different aspects of learning. Below we compare learning via queries—interpreting learning as a one-shot process in which the learner i...
ICCAD
2006
IEEE
15 years 7 months ago
2006
IEEE
Because of the increasing dominance of interconnect issues in advanced IC technology, placement has become a critical step in the IC design flow. To get accurate interconnect inf...
ICCAD
2003
IEEE
15 years 7 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...