8808 search results - page 1755 / 1762 » Process Change Patterns |
TCAD
2010
14 years 4 months ago
2010
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
TE
2010
14 years 4 months ago
2010
The Electrical Engineering Summer Academy for Pre-College Students was held at the University of Tulsa from June 11th through June 15th , 2007. Of the 20 students accepted, 19 par...
121
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TPDS
2010
14 years 4 months ago
2010
Predicting grid performance is a complex task because heterogeneous resource nodes are involved in a distributed environment. Long execution workload on a grid is even harder to pr...
172
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VCBM
2010
14 years 4 months ago
2010
We present the latest developments in modeling 3D biomedical data via the Medial Scaffold (MS), a 3D acyclic oriented graph representation of the Medial Axis (MA) [LK07, SP08]. Th...
101
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CGO
2011
IEEE
14 years 1 months ago
2011
IEEE
—Approximating ideal program outputs is a common technique for solving computationally difficult problems, for adhering to processing or timing constraints, and for performance ...