In this paper, a novel design space exploration approach is proposed that enables a concurrent optimization of the topology, the process binding, and the communication routing of ...
Image model plays a critical role in recovering diagnosis-relevant information from noisy observation data. Unlike conventional denoising techniques based on local models, a patch...
To address performance limitations and expand their applications range, emerging and mature display technologies rely on the design of novel display controllers. Under current mod...
David Antonio-Torres, Paul F. Newbury, Paul F. Lis...
We present a flexible method for bus and network on chip performance analysis, which is based on the adaptation of workload models to resemble various applications. Our analysis m...
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...