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DAC
2011
ACM
14 years 5 months ago
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...
Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhr...
124
Voted
DAC
2008
ACM
16 years 6 months ago
An area-efficient high-throughput hybrid interconnection network for single-chip parallel processing
Single-chip parallel processing requires high bandwidth between processors and on-chip memory modules. A recently proposed Mesh-of-Trees (MoT) network provides high throughput and...
Aydin O. Balkan, Gang Qu, Uzi Vishkin
DAC
2003
ACM
16 years 6 months ago
A complexity effective communication model for behavioral modeling of signal processing applications
In this paper, we argue that the address space of memory regions that participate in inter task communication is over-specified by the traditional communication models used in beh...
M. N. V. Satya Kiran, M. N. Jayram, Pradeep Rao, S...
DAC
2009
ACM
16 years 11 days ago
PiCAP: a parallel and incremental capacitance extraction considering stochastic process variation
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
Fang Gong, Hao Yu, Lei He
124
Voted
DATE
2009
IEEE
131views Hardware» more  DATE 2009»
16 years 9 days ago
Process Variation Aware SRAM/Cache for aggressive voltage-frequency scaling
this paper proposes a novel Process Variation Aware SRAM architecture designed to inherently support voltage scaling. The peripheral circuitry of the SRAM is modified to selectivel...
Avesta Sasan, Houman Homayoun, Ahmed M. Eltawil, F...