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179
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DATE
2006
IEEE
16 years 13 days ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
134
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FCCM
2006
IEEE
16 years 13 days ago
2006
IEEE
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
171
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FDL
2006
IEEE
16 years 13 days ago
2006
IEEE
To ensure correctness and performance of real-time embedded systems, early evaluation of properties is needed. Based on design experience for real-time systems and using the conce...
150
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ICMCS
2006
IEEE
16 years 12 days ago
2006
IEEE
An iterative model selection algorithm is proposed. The algorithm seeks relevant features and an optimal number of codewords (or codebook size) as part of the optimization. We use...
156
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IJCNN
2006
IEEE
16 years 12 days ago
2006
IEEE
—The stationarity hypothesis is largely and implicitly assumed when designing classifiers (especially those for industrial applications) but it does not generally hold in practic...