During the last year we have been designing and studying a computer based tool intended to strengthen social group awareness within a research laboratory. While awareness has been...
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-dura...
— The worst-case delay/power of function units has been used in traditional high level synthesis to facilitate design space exploration. As technology scales to nanometer regime,...