157 search results - page 6 / 32 » Process Variation Aware Issue Queue Design |
TVLSI
2010
14 years 4 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
Process variations due to lens aberrations are to a large extent systematic, and can be modeled for purposes of analyses and optimizations in the design phase. Traditionally, vari...
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Variability of circuit performance is becoming a very important issue for ultra-deep sub-micron technology. Gate length variation has the most direct impact on circuit performance...
TVLSI
2008
14 years 9 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
ASPDAC
2005
ACM
14 years 11 months ago
2005
ACM
The synthesis of clock network in the presence of process variation is becoming a vital design issue towards the performance of digital circuits. In this paper, we propose a clock ...