Historically, business process design has been driven by business objectives, specifically process improvement. However this cannot come at the price of control objectives which s...
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
Jin Sun, Avinash Karanth Kodi, Ahmed Louri, Janet ...
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the e...
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
In the public sector (particularly in the UK in light of recent reforms i.e. the Local Government Act 2000, etc.) a greater degree of accountability and public involvement or inte...
Patrick G. Watson, Penny Duquenoy, Margaret Brenna...