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VLSID
2006
IEEE
15 years 5 months ago
2006
IEEE
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
ISCAS
2006
IEEE
15 years 5 months ago
2006
IEEE
— We describe the design of a contact imager for applications in lab-on-a-chip systems, such as sample preparation and manipulation and monitoring of cells. This is a challenging...
VTC
2008
IEEE
15 years 5 months ago
2008
IEEE
—This paper studies the admission control and resource allocation in a cell-based wireless system that supports singlemedia and multirate services. Utilizing the idea of adaptive...
CORR
2010
Springer
14 years 11 months ago
2010
Springer
l invaders in the form of pathogens. In this research, and abstract model of DC behaviour is developed and subsequently used to form an algorithm, the DCA. The abstraction process ...
ICCAD
2004
IEEE
15 years 8 months ago
2004
IEEE
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...