Recently, processor power density has been increasing at an alarming rate resulting in high on-chip temperature. Higher temperature increases current leakage and causes poor relia...
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
The interlock and forwarding logic is considered the tricky part of a fully-featured pipelined microprocessor and especially debugging these parts delays the hardware design proce...
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
This paper presents a very efficient and versatile method to handle Dynamic Voltage Scaling for minimizing energy consumption in an embedded system processor while maintaining rea...