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ITC
2003
IEEE
158views Hardware» more  ITC 2003»
15 years 3 months ago
Extraction Error Diagnosis and Correction in High-Performance Designs
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
IWPSE
2003
IEEE
15 years 3 months ago
Lightweight Prevention of Architectural Erosion
Avoiding architectural erosion helps extend the lifetime of an evolving software system. Erosion can be reduced by ensuring that (i) developers share a good understanding of a sys...
Ciaran O'Reilly, Philip J. Morrow, David W. Bustar...
CTRSA
2003
Springer
120views Cryptology» more  CTRSA 2003»
15 years 3 months ago
Simple Backdoors for RSA Key Generation
We present extremely simple ways of embedding a backdoor in the key generation scheme of RSA. Three of our schemes generate two genuinely random primes p and q of a given size, to...
Claude Crépeau, Alain Slakmon
COMPSAC
2002
IEEE
15 years 2 months ago
A Unified Process Support Framework for Global Software Development
There is an increasing trend in global software development, where different parts of a software product are being developed in different organisations. The process aspect of such...
Jin Sa, Elena Maslova
ICTAI
2002
IEEE
15 years 2 months ago
Updating a Hybrid Rule Base with New Empirical Source Knowledge
Neurules are a kind of hybrid rules that combine a symbolic (production rules) and a connectionist (adaline unit) representation. Each neurule is represented as an adaline unit. O...
Jim Prentzas, Ioannis Hatzilygeroudis, Athanasios ...