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WSC
2007
13 years 8 months ago
Sensitivity analysis on causal events of WIP bubbles by a log-driven simulator
Fluctuations of work-in-progress (WIP) levels cause variability of cycle time and often lead to productivity losses in semiconductor wafer fabrication plants. To identify sources ...
Ryo Hirade, Rudy Raymond, Hiroyuki Okano
CCE
2006
13 years 6 months ago
Modeling and temperature control of rapid thermal processing
In the past few years, Rapid Thermal Processes (RTP) have gained acceptance as mainstream technology for semi-conductors manufacturing. These processes are characterized by a sing...
Eyal Dassau, Benyamin Grosman, Daniel R. Lewin
WSC
1997
13 years 7 months ago
Simulation of Bulk Flow and High Speed Operations
Simulation modeling can be highly effective for solving problems found in the food, beverage, consumer products, and pharmaceutical industries. The flow of material or fluid in th...
Andrew J. Siprelle, Richard A. Phelps
WSC
2008
13 years 8 months ago
Coping with typical unpredictable incidents in a logic fab
Within the last months the semiconductor plant of Infineon in Dresden has converted to a pure manufacturer of logic products. With it, premises for production control have changed...
Wolfgang Scholl
ACSD
2004
IEEE
124views Hardware» more  ACSD 2004»
13 years 10 months ago
A Behavioral Type Inference System for Compositional System-on-Chip Design
The design productivity gap has been recognized by the semiconductor industry as one of the major threats to the continued growth of system-on-chips and embedded systems. Ad-hoc s...
Jean-Pierre Talpin, David Berner, Sandeep K. Shukl...