208 search results - page 13 / 42 » Programmer-based fault prediction |
ISCA
2007
IEEE
15 years 6 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
122
Voted
ICPP
2008
IEEE
15 years 6 months ago
2008
IEEE
Despite great efforts on the design of ultra-reliable components, the increase of system size and complexity has outpaced the improvement of component reliability. As a result, fa...
AICCSA
2006
IEEE
15 years 2 months ago
2006
IEEE
In this paper we apply a machine learning approach to the problem of estimating the number of defects called Regression via Classification (RvC). RvC initially automatically discr...
90
Voted
DFT
2002
IEEE
15 years 5 months ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
ICRA
2006
IEEE
15 years 6 months ago
2006
IEEE
- In this article, a set membership (SM) identification technique is tailored to detect faults in microelectromechanical systems. The SM-identifier estimates an orthotope which con...