— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
The transition of personal information management (PIM) tools off the desktop to the Web presents an opportunity to augment these tools with capabilities provided by the wealth o...
Max Van Kleek, Brennan Moore, David R. Karger, Pau...
The linear scan algorithm for register allocation provides a good register assignment with a low compilation overhead and is thus frequently used for just-in-time compilers. Altho...