Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
The importance of distributed systems is growing as computing devices become ubiquitous and bandwidth becomes plentiful. Concurrency and distribution pose algorithmic and implemen...
Recent years have seen a resurgence of interest in programming by demonstration. As end users have become increasingly sophisticated, computer and artificial intelligence technolo...
Selection tasks are common in modern computer interfaces: we are often required to select a set of files, emails, data entries, and the like. File and data browsers have sorting a...