We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
SIMD extension is one of the most common and effective technique to exploit data-level parallelism in today’s processor designs. However, the performance of SIMD architectures i...
This paper presents a technique to map automatically a complete digital signal processing (DSP) application onto a parallel machine with distributed memory. Unlike other applicati...
As partial evaluation gets more mature, it is now possible to use this program transformation technique to tackle realistic languages and real-size application programs. However, t...