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105
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ETS
2010
IEEE
174views Hardware» more  ETS 2010»
15 years 6 days ago
Test-architecture optimization for TSV-based 3D stacked ICs
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakr...
GECCO
2008
Springer
143views Optimization» more  GECCO 2008»
15 years 6 days ago
A parallel evolutionary algorithm for unconstrained binary quadratic problems
In this paper an island model is described for the unconstrained Binary Quadratic Problem (BQP), which can be used with up to 2500 binary variables. Our island model uses a master...
István Borgulya
COMPSAC
2008
IEEE
14 years 11 months ago
Superfit Combinational Elusive Bug Detection
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
R. Barzin, S. Fukushima, William E. Howden, S. Sha...
85
Voted
FCCM
2008
IEEE
176views VLSI» more  FCCM 2008»
14 years 11 months ago
The Effectiveness of Configuration Merging in Point-to-Point Networks for Module-based FPGA Reconfiguration
Communications infrastructure for modular reconfiguration of FPGAs needs to support the changing communications interfaces of a sequence of modules. In order to avoid the overhead...
Shannon Koh, Oliver Diessel
CCE
2008
14 years 11 months ago
Chemical supply chain network optimization
Chemical supply chain networks provide large opportunities for cost reductions through the redesign of the flow of material from producer to customer. In this paper we present a m...
Jeff Ferrio, John Wassick