6274 search results - page 1252 / 1255 » Proofs, Programs, Processes |
117
click to vote
TCAD
2010
14 years 10 months ago
2010
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
183
click to vote
TCAD
2010
14 years 10 months ago
2010
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
145
click to vote
TON
2010
14 years 10 months ago
2010
Abstract-- Security issues and attack management in transparent WDM (Wavelength Division Multiplexing) optical networks has become of prime importance to network operators due to t...
153
click to vote
TSP
2010
14 years 10 months ago
2010
Effective spectrum sensing is a critical prerequisite for multi-channel cognitive radio (CR) networks, where multiple spectrum bands are sensed to identify transmission opportuniti...
161
click to vote
LR
2011
14 years 9 months ago
2011
Scopus is the world’s largest abstract and citation database of peer-reviewed literature and quality web sources (-> http://www.info.sciverse.com/scopus). ontains 41 million r...