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128
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ICSM
2007
IEEE
15 years 7 months ago
2007
IEEE
Test suite reduction seeks to reduce the number of test cases in a test suite while retaining a high percentage of the original suite’s fault detection effectiveness. Most appro...
102
Voted
ATS
2001
IEEE
15 years 4 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
85
Voted
ATS
2009
IEEE
15 years 7 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
89
Voted
ICST
2008
IEEE
15 years 7 months ago
2008
IEEE
We present a model-based approach to testing access control requirements. By using combinatorial testing, we first automatically generate test cases from and without access contro...
109
Voted
GI
2007
Springer
15 years 6 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...