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77
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DATE
2010
IEEE
120views Hardware» more  DATE 2010»
15 years 5 months ago
Memory testing with a RISC microcontroller
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
A. J. van de Goor, Georgi Gaydadjiev, Said Hamdiou...
ICST
2011
IEEE
14 years 4 months ago
Exploiting Common Object Usage in Test Case Generation
—Generated test cases are good at systematically exploring paths and conditions in software. However, generated test cases often do not make sense. We adapt test case generation ...
Gordon Fraser, Andreas Zeller
116
Voted
ISCAS
2011
IEEE
248views Hardware» more  ISCAS 2011»
14 years 4 months ago
SNR measurement based on linearity test for ADC BIST
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...
Jingbo Duan, Degang Chen
108
Voted
BMCBI
2008
98views more  BMCBI 2008»
15 years 24 days ago
MTAP: The Motif Tool Assessment Platform
Background: In recent years, substantial effort has been applied to de novo regulatory motif discovery. At this time, more than 150 software tools exist to detect regulatory bindi...
Daniel Quest, Kathryn Dempsey, Mohammad Shafiullah...
PTS
2003
73views Hardware» more  PTS 2003»
15 years 2 months ago
Testing Transition Systems with Input and Output Testers
The paper studies testing based on input/output transition systems, also known as input/output automata. It is assumed that a tester can never prevent an implementation under test ...
Alexandre Petrenko, Nina Yevtushenko, Jiale Huo