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CORR
2008
Springer
84views Education» more  CORR 2008»
15 years 1 months ago
Efficiently Testing Sparse GF(2) Polynomials
We give the first algorithm that is both query-efficient and time-efficient for testing whether an unknown function f : {0, 1}n {-1, 1} is an s-sparse GF(2) polynomial versus -far ...
Ilias Diakonikolas, Homin K. Lee, Kevin Matulef, R...
MOC
2000
94views more  MOC 2000»
15 years 28 days ago
Irreducibility testing over local fields
The purpose of this paper is to describe a method to determine whether a bivariate polynomial with rational coefficients is irreducible when regarded as an element in Q((x))[y], th...
P. G. Walsh
STOC
2009
ACM
99views Algorithms» more  STOC 2009»
16 years 1 months ago
Testing juntas nearly optimally
A function on n variables is called a k-junta if it depends on at most k of its variables. In this article, we show that it is possible to test whether a function is a k-junta or ...
Eric Blais
DAC
2000
ACM
16 years 2 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
ATS
2005
IEEE
132views Hardware» more  ATS 2005»
15 years 6 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Vishwani D. Agrawal, Alok S. Doshi