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ECLIPSE
2007
ACM
15 years 4 months ago
UnitPlus: assisting developer testing in Eclipse
In the software development life cycle, unit testing is an important phase that helps in early detection of bugs. A unit test case consists of two parts: a test input, which is of...
Yoonki Song, Suresh Thummalapenta, Tao Xie
95
Voted
GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
15 years 4 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
COCO
2009
Springer
115views Algorithms» more  COCO 2009»
15 years 4 months ago
On the Communication Complexity of Read-Once AC^0 Formulae
Abstract--We study the 2-party randomized communication complexity of read-once AC0 formulae. For balanced AND-OR trees T with n inputs and depth d, we show that the communication ...
T. S. Jayram, Swastik Kopparty, Prasad Raghavendra
112
Voted
CC
2006
Springer
124views System Software» more  CC 2006»
15 years 4 months ago
Polyhedral Code Generation in the Real World
The polyhedral model is known to be a powerful framework to reason about high level loop transformations. Recent developments in optimizing compilers broke some generally accepted ...
Nicolas Vasilache, Cédric Bastoul, Albert C...
110
Voted
CIKM
2006
Springer
15 years 4 months ago
Finding highly correlated pairs efficiently with powerful pruning
We consider the problem of finding highly correlated pairs in a large data set. That is, given a threshold not too small, we wish to report all the pairs of items (or binary attri...
Jian Zhang, Joan Feigenbaum