13214 search results - page 26 / 2643 » Pseudorandomness for network algorithms |
165
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VTS
2003
IEEE
15 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
154
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...